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Volumn 710, Issue , 2013, Pages 42-47

Investigations on the spatial resolution of autocollimator-based slope measuring profilers

Author keywords

LTP; Metrology; NOM; Synchrotron optics; X ray optics

Indexed keywords

IMAGE RESOLUTION; MEASUREMENTS; PLASMA JETS; X RAY OPTICS;

EID: 84891903386     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2012.10.130     Document Type: Article
Times cited : (31)

References (25)
  • 1
    • 77950850815 scopus 로고    scopus 로고
    • The nanometer optical component measuring machine: A new sub-nm topography measuring device for X-ray optics at BESSY
    • American Institute of Physics, Mellville, NY
    • F. Siewert, T. Noll, T. Schlegel, T. Zeschke, H. Lammert, The nanometer optical component measuring machine: a new sub-nm topography measuring device for X-ray optics at BESSY, in: AIP Conference Proceedings, vol. 705, American Institute of Physics, Mellville, NY, 2004, pp. 847-850.
    • (2004) AIP Conference Proceedings , vol.705 , pp. 847-850
    • Siewert, F.1    Noll, T.2    Schlegel, T.3    Zeschke, T.4    Lammert, H.5
  • 2
    • 77950858722 scopus 로고    scopus 로고
    • Optisches Messverfahren und Präzisionsmessmaschine zur Ermittlung von Idealformabweichungen technisch polierter Oberfl̈achen
    • Patent no. DE 103 03 659, 28 July
    • H. Lammert, T. Noll, T. Schlegel, F. Siewert, T. Zeschke, Optisches Messverfahren und Präzisionsmessmaschine zur Ermittlung von Idealformabweichungen technisch polierter Oberfl̈achen, Patent no. DE 103 03 659, 28 July 2005.
    • (2005)
    • Lammert, H.1    Noll, T.2    Schlegel, T.3    Siewert, F.4    Zeschke, T.5
  • 8
    • 0033343741 scopus 로고    scopus 로고
    • Novel scanning technique for ultra-precise measurement of topography
    • Optical Manufacturing and Testing III, Bellingham, WA
    • I. Weingärtner, M. Schulz, C. Elster, Novel scanning technique for ultra-precise measurement of topography, in: Optical Manufacturing and Testing III, Proceedings of SPIE, vol. 3782, Bellingham, WA, 1999.
    • (1999) Proceedings of SPIE , vol.3782
    • Weingärtner, I.1    Schulz, M.2    Elster, C.3
  • 10
    • 42149119162 scopus 로고    scopus 로고
    • Proposal for a universal test mirror for characterization of slope measuring instruments
    • Advances in Metrology for X-Ray and EUV Optics II, Bellingham, WA
    • V. Yashchuk, W. McKinney, T. Warwick, T. Noll, F. Siewert, T. Zeschke, R. Geckeler, Proposal for a universal test mirror for characterization of slope measuring instruments, in: Advances in Metrology for X-Ray and EUV Optics II, Proceedings of the SPIE, vol. 6704, Bellingham, WA, 2007.
    • (2007) Proceedings of the SPIE , vol.6704
    • Yashchuk, V.1    McKinney, W.2    Warwick, T.3    Noll, T.4    Siewert, F.5    Zeschke, T.6    Geckeler, R.7
  • 15
  • 20
    • 1842556549 scopus 로고    scopus 로고
    • Finishing procedure for high performance synchrotron optics
    • Optical Manufacturing and Testing V
    • A. Schindler, T. Haensel, A. Nickel, H. Lammert, F. Siewert, Finishing procedure for high performance synchrotron optics, Optical Manufacturing and Testing V, Book Series: Proceedings of SPIE, vol. 5180, 2003, pp. 64-72.
    • (2003) Book Series: Proceedings of SPIE , vol.5180 , pp. 64-72
    • Schindler, A.1    Haensel, T.2    Nickel, A.3    Lammert, H.4    Siewert, F.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.