Computational surface and roundness metrology

Computational Surface and Roundness Metrology

Volumn , Issue , 2009, Pages 1-263

  Muralikrishnan, Bala ^a,b   Raja, Jay ^b  

^a KT Consulting Inc   (United States)

^b University of North Carolina at Charlotte   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84891389196     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1007/978-1-84800-297-5     Document Type: Book

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