Computational metrology for the design and manufacture of product geometry: A classification and synthesis

Journal of Computing and Information Science in Engineering

Volumn 7, Issue 1, 2007, Pages 3-9

  Srinivasan, Vijay ^a,b  

^a Och Spine at New York Presbyterian Hospitals   (United States)

^b UNIVERSITY OF NORTH CAROLINA AT CHARLOTTE   (United States)

Author keywords

Convolution; Design; Filtering; Fitting; Manufacturing; Metrology; Optimization; Production; Specification; Standards; Tolerancing; Verification

Indexed keywords

COMPUTATIONAL METROLOGY; COMPUTATIONAL PROBLEMS; DESIGN VERIFICATION; GEOMETRIC DATA; PRODUCT GEOMETRY;

COMBINATORIAL OPTIMIZATION; COMPUTATIONAL GEOMETRY; CONVOLUTION; CURVE FITTING; DATA REDUCTION; FITS AND TOLERANCES; MEASUREMENT THEORY; SET THEORY;

PRODUCT DESIGN;

EID: 34248229309     PISSN: 15309827     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.2424246     Document Type: Article

References (19)

1. Srinivasan, V., 2005, "Elements of Computational Metrology," DIMACS Book Series, Vol. 67, R. Janardan, M. Smid, and D. Dutta, eds., Computer Aided Design and Manufacturing, American Mathematical Society, R.I., pp. 79-116.
2. Srinivasan, V., 1991, "A Geometer Grapples with Tolerancing Standards," Proceedings of the CIRP International Working Seminar on Computer Aided Tolerancing, Penn. State University, College Station, PA.
3. Srinivasan, V., 1996, "How Tall is the Pyramid of Cheops?... and Other Problems in Computational Metrology," SIAM News, April, Society for Industrial and Applied Mathematics, Philadelphia, PA.
4. Srinivasan, V., 1994, "Plato's Factory," ASME Manufacturing Review, Vol. 7, No. 4.
5. ISO, 1993, Guide to the Expression of Uncertainty in Measurement, International Organization for Standardization, Geneva, Switzerland.
6. Taylor, B. N., and Kuyatt, C. E., 1994, "Guidelines for Evaluating and Expressing the Uncertainty of NIST Measurement Results," Technical Note 1297, National Institute of Standards and Technology.
7. ASME Y14.5, 1994, Dimensioning and Tolerancing, The American Society of Mechanical Engineers, New York.
8. ISO 1101, 2004, Geometrical Product Specifications (GPS) - Geometrical Tolerancing - Tolerances of Form, Orientation, Location and Run-out, 2nd, ed., International Organization for Standardization, Geneva, Switzerland.
9. ASME Y14.41, 2003, Digital Product Definition Data Practices, The American Society of Mechanical Engineers, New York.
10. ISO 16792, 2005, Technical Product Documentation - Digital Product Definition Data Practices, International Organization for Standardization, Geneva, Switzerland.
11. Shakarji, C. M., 1998, "Least-Squares Fitting Algorithms of the NIST Algorithm Testing System," J. Res. Natl. Inst. Stand. Technol., 103, pp. 633-641.
12. Forbes, A., 1991, Least-Squares Bets-fit Geometrical Elements, NPL Report DITC 140/89, National Physical Laboratory, U.K.
13. Anthony, G. T., Anthony, H. M., Bittner, B., Butler, B. P., Cox, M. G., Drieschner, R., Elligsen, R., Forbes, A. B., Gross, H., Hannaby, S. A., Harris, P. M., and Kok, J., 1993, Chebyshev Best-fit Geometric Elements, NPL Report DITC 221/93, National Physical Laboratory, U.K.
14. ISO/TS 17450-1, 2005, Geometrical Product Specifications (GPS)-General Concepts - Part I: Model for geometrical specification and verification, 1st ed., International Organization for Standardization, Geneva, Switzerland.
15. Houle, M. E., and Toussaint, G. T., 1988, "Computing the Width of a Set," IEEE Trans. Pattern Anal. Mach. Intell., 10, pp. 761-765.
16. Whitehouse, D., 2002, Surfaces and their Measurements, Taylor & Francis, New York.
17. Raja, J., Muralikrishnan, B., and Fu, S., 2002, "Recent Advances in'Separation of Roughness, Waviness and Form," Precis. Eng., 26, pp. 222-235.
18. Krystek, M., Scott, P. J., and Srinivasan, V., 2000, "Discrete Linear Filters for Metrology," Proceedings of the 16th IMEKO World Congress, Hofburg, Wien, Austria.
19. Srinivasan, V., 1998, "Discrete Morphological Filters for Metrology," Proceedings of the 6th ISMQC Symposium on Metrology for Quality Control in Production, TU Wien, Austria.