Characterization of engineered surfaces

Journal of Physics: Conference Series

Volumn 13, Issue 1, 2005, Pages 5-8

  Verma, Ritwik ^a   Raja, Jay ^a  

^a University of North Carolina at Charlotte   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 24644474859     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/13/1/002     Document Type: Conference Paper

References (7)

1. Mainsah E, Dong W P, Stout K J 1996 Proc. SPIE 2599 141-154
2. Stout K J, Sullivan P J, Dong W P, Mainsah E, Luo N, Mathia T and Zahouni H 1993 The Development of Methods for the Characterization of Roughness in Three Dimensions (Commission of the European Communities) EUR 15178 EN, ISBN 0 7044 1313 2
3. Mainsah E, Stout K J, Sullivan P J 1994 Meas. Sci. Technol. 5 172-181
4. Sullivan P J, Blunt L 1992 Wear 159 207-221
5. Blunt L, Jiang X, Scott P and Xiao S 2004 Surface Metrology of MST Devices Proc. Int. Conf. Colloquium on Surfaces (Chemnitz Germany)
6. Gonzalez R and Woods R 2002 Digital Image Processing (New York: Prentice Hall)
7. Forbes A B 1989 Least-squares best-fit geometric elements NPL Report DITC 140/89 (National Physical Laboratory, Great Britain)