Recent advances in separation of roughness, waviness and form

Precision Engineering

Volumn 26, Issue 2, 2002, Pages 222-235

  Raja, J ^a   Muralikrishnan, B ^a   Fu, Shengyu ^a  

^a University of North Carolina at Charlotte   (United States)

Author keywords

Filters; Roughness; Surface metrology; Waviness

Indexed keywords

BANDWIDTH; CORRELATION METHODS; DIGITAL FILTERS; FREQUENCIES; MORPHOLOGY; PROCESS CONTROL; SURFACE MEASUREMENT;

SURFACE METROLOGY; WAVINESS;

SURFACE ROUGHNESS;

EID: 0036540268     PISSN: 01416359     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0141-6359(02)00103-4     Document Type: Article

References (25)

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4. Filtering of surface profiles using fast Fourier transform
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6. A fast algorithm for determining the Gaussian filtered mean line in surface metrology
7. Discrete linear profile filters
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9. Development of a robust Gaussian regression filter for three-dimensional surface analysis
10. Accessing roughness in three-dimensions using Gaussian regression filtering
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12. Analyzing engineering surface using wavelet filter
13. A theory for multi-resolution signal decomposition: The wavelet representation
14. Wavelets and filter banks: Theory and design
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16. Development of a lifting wavelet representation for surface characterization
17. Discrete morphological filters for metrology
18. Scale-space techniques