Engineering surface analysis with different wavelet bases

Journal of Manufacturing Science and Engineering

Volumn 125, Issue 4, 2003, Pages 844-852

  Fu, Shengyu ^a   Muralikrishnan, B ^a   Raja, J ^a  

^a University of North Carolina at Charlotte   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; FOURIER TRANSFORMS; FREQUENCY DOMAIN ANALYSIS; MATHEMATICAL MODELS; STANDARDS; SURFACE ROUGHNESS; TIME DOMAIN ANALYSIS; WAVELET TRANSFORMS;

ENGINEERING SURFACE ANALYSIS; SURFACE TEXTURE ANALYSIS;

PRECISION ENGINEERING;

EID: 0344515488     PISSN: 10871357     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.1616947     Document Type: Article

References (21)

1. ASME B46.1, 1995, Surface Texture (Surface Roughness, Waviness, and Lay).
2. Raja, J., Muralikrishnan, B., and Fu, S., 2002, "Recent Advances in Separation of Roughness, Waviness and Form," Precis. Eng., 26(2).
3. Jiang, X. Q., Blunt, L., and Stout, K. J., 2000, "Development of a Lifting Wavelet Representation for Surface Characterization," Proc. R. Soc. London, Ser. A, 456, pp. 2283-2313.
4. Chen, X., Raja, J., and Simanapali, S., 1995, "Multi-Scale Analysis of Engineering Surfaces," Int. J. Mach. Tools Manuf., 35(2), pp. 231-238.
5. Liu, X., and Raja, J., 1996, "The Application of Wavelet Filter Bank in Surface Metrology," SPIE, 2825, Aug.
6. Chen, Q., Yang, S., and Li, Z., 1999, "Surface Roughness Evaluation by Using Wavelet Analysis," Precis. Eng., 23.
7. Heisenberg, Werner, 1949, Physical Principles of the Quantum Theory, Dover Publications Inc.
8. Mallat, Stephane, 1989, "Multifrequency Channel Decompositions of Images and Wavelet Models," IEEE Trans. Acoust. Speech Signal Process, 37(12), pp. 2091-2110.
9. Meyer, Y., 1993, Wavelets: Analysis and Applications, SIAM Press, Philadelphia.
10. Mallat, Stephane, 1999, A Wavelet Tour of Signal Processing, Second edition, Academic Press.
11. Strang, G., and Nguyen, T. Q., 1996, Wavelets and Filter Banks, Wellesley-Cambridge Press, Wellesley.
12. Daubechies, I., 1992, Ten Lectures on Wavelets, The Society for Industrial and Applied Mathematics.
13. Daubechies, I., 1989, "Orthonormal Bases of Compactly Supported Wavelets II. Variations on a Theme," Technical Memo., #11217-891116-17, AT&T Bell Labs., Murray Hill.
14. Daubechies, I., 1988, "Orthonormal Bases of Compactly Supported Wavelets," Commun. Pure Appl. Math., 41, pp. 909-996.
15. Cohen, A., Daubechies, I., and Feauveau, J. C., 1992, "Biorthogonal Bases of Compactly Supported Wavelets," Commun. Pure Appl. Math. 45, pp. 485-560.
16. ISO 11562, 1996, Geometrical Product Specification (GPS) - Surface Texture: Profile Method - Metrological Characteristics of Phase Correct Filters, International Organization for Standardization, Geneva.
17. Bhargava, S., and Grant, M. B., 1993, "Taguchi Methods and Tolerance Assignment - The Wavelength Aspects of Surface Metrology," Proceedings of the 1993 International Forum on Dimensional Tolerancing and Metrology, Dearborn, MI, June 17-19.
18. Liu, X., Raja, J., and Sannareddy, H., 1995, "Assessment of Plateau Honed Surface Texture Using Wavelet Transform," Proc. ASPE, 14, pp. 672-675.
19. Jiang, X. Q., Blunt, L., and Stout, K. J., 1997, "Evaluation of Functional Features of the Orthopaedic Joint Prosthses Surfaces Using Wavelet Analysis," Proc. ASPE 1997 Spring Topical Meeting, Advances in Surface Metrology, Annapolis, Maryland.
20. Thomas, T. R., and Charlton, G., 1981, "Variation of Roughness Parameters on Some Typical Manufactured Surfaces," Precis. Eng., 3(2), pp. 91-96.
21. ISO 13565-1:1996(E), Geometrical Product Specification (GPS) - Surface Texture: Profile Method; Surfaces Having Stratified Functional Properties - Part 1: Filtering and General Measurement Conditions, International Organization for Standardization, Geneva.