Tuning the properties of VO2 thin films through growth temperature for infrared and terahertz modulation applications

Journal of Applied Physics

Volumn 114, Issue 11, 2013, Pages

  Zhao, Yong ^a   Chen, Changhong ^b   Pan, Xuan ^a   Zhu, Yanhan ^a   Holtz, Mark ^c   Bernussi, Ayrton ^a   Fan, Zhaoyang ^a  

^a Department of Electrical and Computer Engineering   (United States)

^b HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^c TEXAS STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRICAL AND OPTICAL PROPERTIES; ELECTRICAL MEASUREMENT; HIGH CONDUCTIVITY; HIGH RESISTIVITY; MORPHOLOGY CHANGES; NON-STOICHIOMETRIC PHASIS; TERAHERTZ TRANSMISSION; VANADIUM DIOXIDE;

GROWTH TEMPERATURE; MODULATION; OPTICAL PROPERTIES; THIN FILMS; X RAY DIFFRACTION;

ELECTRIC PROPERTIES;

EID: 84887483698     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4821846     Document Type: Article

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