Effect of substrate orientation on terahertz optical transmission through VO2 thin films and application to functional antireflection coatings

Journal of the Optical Society of America B: Optical Physics

Volumn 29, Issue 9, 2012, Pages 2373-2378

  Zhu, Yanhan ^a   Zhao, Yong ^a   Holtz, Mark ^a   Fan, Zhaoyang ^a   Bernussi, Ayrton A ^a  

^a Department of Electrical and Computer Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIREFLECTION COATINGS; COATINGS; ELECTRIC CONDUCTIVITY; METAL INSULATOR BOUNDARIES; OPTICAL CONDUCTIVITY; REFRACTIVE INDEX; SAPPHIRE; THIN FILMS;

ANTI-REFLECTING COATING; CRYSTAL QUALITIES; DRUDE MODELS; ELECTRICAL RESISTIVITY MEASUREMENTS; GRAIN MORPHOLOGIES; IMAGINARY PARTS; METAL-INSULATOR PHASE TRANSITION; METALLIC STATE; SAPPHIRE SUBSTRATES; SUBSTRATE ORIENTATION; TERAHERTZ; THZ FREQUENCIES; VANADIUM DIOXIDE;

SUBSTRATES;

EID: 84866429135     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.29.002373     Document Type: Article

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