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Applied Physics Letters

Volumn 102, Issue 1, 2013, Pages

Synchrotron radiation study of VO2 crystal film epitaxial growth on sapphire substrate with intrinsic multi-domains

(6) Fan, L L a Wu, Y F a Si, C b Pan, G Q a Zou, C W a Wu, Z Y a,b

a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA (China)

b INSTITUTE OF HIGH ENERGY PHYSICS (China)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL FILMS; FINE STRUCTURES; GROWTH BEHAVIOR; GROWTH MODELS; HEXAGONAL SUBSTRATES; HIGH RESOLUTION; MONOCRYSTALLINE SUBSTRATES; MULTI-DOMAINS; SAPPHIRE SUBSTRATES; SYNCHROTRON RADIATION X-RAY DIFFRACTIONS; VERTICAL PLANE; XRD;

PLASTIC FILMS; PULSED LASER DEPOSITION; SAPPHIRE; SYNCHROTRON RADIATION; X RAY DIFFRACTION;

EPITAXIAL GROWTH;

EID: 84872279762 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4775580 Document Type: Article

Times cited : (47)

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