Determination of the V2p XPS binding energies for different vanadium oxidation states (V5+ to V0+)

Journal of Electron Spectroscopy and Related Phenomena

Volumn 135, Issue 2-3, 2004, Pages 167-175

  Silversmit, Geert ^a   Depla, Diederik ^a   Poelman, Hilde ^a   Marin, Guy B ^a   De Gryse, Roger ^a  

^a GHENT UNIVERSITY   (Belgium)

Author keywords

Oxidation state; V2p photoelectron core level; Vanadium oxide; X ray photoelectron spectroscopy (XPS); XPS analysis

Indexed keywords

BINDING ENERGY; DATA REDUCTION; HYDROCARBON REFINING; ION BOMBARDMENT; OXIDATION; SILICA; SINGLE CRYSTALS; SPECTRUM ANALYSIS; TITANIUM DIOXIDE; X RAY PHOTOELECTRON SPECTROSCOPY;

OXIDATION STATES; V2P PHOTOELECTRON CORE LEVEL; VANADIUM OXIDE; XPS ANALYSIS;

VANADIUM COMPOUNDS;

EID: 2942672945     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2004.03.004     Document Type: Article

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