Quantum conductance in silicon oxide resistive memory devices

Scientific Reports

Volumn 3, Issue , 2013, Pages

  Mehonic, A ^a   Vrajitoarea, A ^a   Cueff, S ^b,c   Hudziak, S ^a   Howe, H ^a   Labbe C ^b   Rizk, R ^b   Pepper, M ^a   Kenyon, A J ^a  

^a UNIVERSITY COLLEGE LONDON   (United Kingdom)

^b Direction de la Recherche Fondamentale   (France)

^c Brown University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84884599613     PISSN: None     EISSN: 20452322     Source Type: Journal    
DOI: 10.1038/srep02708     Document Type: Article

References (28)

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