Mesoscopic approach to the soft breakdown failure mode in ultrathin SiO2 films

Applied Physics Letters

Volumn 78, Issue 2, 2001, Pages 225-227

  Miranda, Enrique ^a   Suñé, Jordi ^b  

^a UNIVERSIDAD DE BUENOS AIRES   (Argentina)

^b UNIVERSITAT AUTÒNOMA DE BARCELONA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002433902     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1339259     Document Type: Article

References (25)

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