SCOPUS 정보 검색 플랫폼

Nanoscale

Volumn 5, Issue 19, 2013, Pages 9170-9175

Bases for time-resolved probing of transient carrier dynamics by optical pump-probe scanning tunneling microscopy

(6) Yokota, Munenori a Yoshida, Shoji a Mera, Yutaka b Takeuchi, Osamu a Oigawa, Haruhiro a Shigekawa, Hidemi a

a UNIVERSITY OF TSUKUBA (Japan)

b UNIVERSITY OF TOKYO (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATION PROCESS; LOGARITHMIC RELATIONSHIP; MICROSCOPY TECHNIQUE; MODEL SIMULATION; OPTIMUM CONDITIONS; RELIABLE MEASUREMENT; SURFACE PHOTOVOLTAGES; TUNNELING BARRIER HEIGHTS;

OPTICAL PUMPING; SCANNING TUNNELING MICROSCOPY;

PROBES;

EID: 84884239139 PISSN: 20403364 EISSN: 20403372 Source Type: Journal
DOI: 10.1039/c3nr02433d Document Type: Article

Times cited : (11)

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