Electrostatic potential for a hyperbolic probe tip near a semiconductor

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 21, Issue 5, 2003, Pages 2080-2088

  Feenstra, R M ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY CONDITIONS; COMPUTER SIMULATION; FERMI LEVEL; FINITE DIFFERENCE METHOD; ITERATIVE METHODS; POISSON EQUATION; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR MATERIALS; VACUUM;

ELECTROSTATIC POTENTIAL; HYPERBOLIC PROBE TIP; METALLIC PROBE TIP;

ELECTROSTATICS;

EID: 0242677567     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1606466     Document Type: Article

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