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Applied Physics Letters

Volumn 84, Issue 18, 2004, Pages 3645-3647

Light-modulated scanning tunneling spectroscopy for nanoscale imaging of surface photovoltage

(3) Takeuchi, Osamu a Yoshida, Shoji a Shigekawa, Hidemi a

a UNIVERSITY OF TSUKUBA (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTANCE; ELECTRIC FIELD EFFECTS; FERMI LEVEL; SCANNING TUNNELING MICROSCOPY; THERMAL EXPANSION; TUNGSTEN;

LIGHT-MODULATED SCANNING TUNNELING SPECTROSCOPY (LM-STS); SPATIALLY RESOLVED SURFACE PHOTOVOLTAGE (SR-SPV); TUNNEL CURRENT; ZERO BIAS VOLTAGE;

LIGHT MODULATION;

EID: 2542475194 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1737063 Document Type: Article

Times cited : (44)

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