Nanometer-scale imaging with an ultrafast scanning tunneling microscope

Applied Physics Letters

Volumn 72, Issue 4, 1998, Pages 504-506

  Steeves, G M ^a   Elezzabi, A Y ^a   Freeman, M R ^a  

^a UNIVERSITY OF ALBERTA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001338806     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120798     Document Type: Article

References (11)

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