A prospective: Quantitative scanning tunneling spectroscopy of semiconductor surfaces

Surface Science

Volumn 603, Issue 18, 2009, Pages 2841-2844

  Feenstra, R M ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Scanning tunneling microscopy

Indexed keywords

ANALYSIS METHOD; BANDBENDING; ELECTROSTATIC MODELING; ENERGY VALUE; MATERIAL SYSTEMS; RADIAL DIRECTION; SCANNING TUNNELING SPECTROSCOPY; SEMI-CONDUCTOR SURFACES; SEMICONDUCTOR SYSTEMS; TIP-INDUCED; TUNNEL CURRENTS; TUNNELING SPECTRA; WAVE-FUNCTIONS;

ELECTRIC POTENTIAL; ELECTROSTATICS; SCANNING TUNNELING MICROSCOPY; SPECTROSCOPY; VACUUM; WIND TUNNELS;

SCANNING;

EID: 69549084679     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2009.08.002     Document Type: Short Survey

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