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Volumn 6, Issue 3, 2013, Pages
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Single-atomic-level probe of transient carrier dynamics by laser-combined scanning tunneling microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC LEVELS;
CARRIER DYNAMICS;
IN-GAP STATE;
PHOTO-INDUCED;
SCANNING TUNNELING SPECTROSCOPY;
STM TECHNIQUE;
TIME RESOLVED MEASUREMENT;
SCANNING TUNNELING MICROSCOPY;
ATOMS;
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EID: 84875545601
PISSN: 18820778
EISSN: 18820786
Source Type: Journal
DOI: 10.7567/APEX.6.032401 Document Type: Article |
Times cited : (25)
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References (24)
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