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Volumn 6, Issue 3, 2013, Pages

Single-atomic-level probe of transient carrier dynamics by laser-combined scanning tunneling microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC LEVELS; CARRIER DYNAMICS; IN-GAP STATE; PHOTO-INDUCED; SCANNING TUNNELING SPECTROSCOPY; STM TECHNIQUE; TIME RESOLVED MEASUREMENT;

EID: 84875545601     PISSN: 18820778     EISSN: 18820786     Source Type: Journal    
DOI: 10.7567/APEX.6.032401     Document Type: Article
Times cited : (25)

References (24)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.