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Volumn , Issue , 2005, Pages 481-566

Multichannel Ellipsometry

Author keywords

[No Author keywords available]

Indexed keywords

MULTICHANNEL;

EID: 84882859433     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1016/B978-081551499-2.50009-5     Document Type: Chapter
Times cited : (30)

References (68)
  • 3
    • 6944257560 scopus 로고
    • Elsevier, Amsterdam, A.C. Boccara, C. Pickering, J. Rivory (Eds.)
    • Thin Solid Films 1993, 233-234. Elsevier, Amsterdam. A.C. Boccara, C. Pickering, J. Rivory (Eds.).
    • (1993) Thin Solid Films
  • 5
    • 4244168297 scopus 로고    scopus 로고
    • Elsevier, Amsterdam, R.W. Collins, D.E. Aspnes, E.A. Irene (Eds.)
    • Thin Solid Films 1998, 313-314. Elsevier, Amsterdam. R.W. Collins, D.E. Aspnes, E.A. Irene (Eds.).
    • (1998) Thin Solid Films
  • 14
    • 85032325339 scopus 로고    scopus 로고
    • 26 rue Pierre Joigneaux, 92270 Bois-Colombes, France
    • SOPRA S.A., 26 rue Pierre Joigneaux, 92270 Bois-Colombes, France.
    • Sopra, S.A.1
  • 15
    • 85032325911 scopus 로고    scopus 로고
    • Suite 102, 645 M Street, Lincoln, NE 68508, USA.
    • J. A. Woollam Co., Suite 102, 645 M Street, Lincoln, NE 68508, USA.
    • Woollam Co, J.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.