Dual rotating-compensator multichannel ellipsometer: Instrument development for high-speed Mueller matrix spectroscopy of surfaces and thin films

Review of Scientific Instruments

Volumn 72, Issue 3, 2001, Pages 1742-1754

  Lee, Joungchel ^a   Koh, Joohyun ^a   Collins, R W ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035275536     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1347969     Document Type: Article

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