Dual rotating-compensator multichannel ellipsometer: Instrument design for real-time Mueller matrix spectroscopy of surfaces and films

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 16, Issue 8, 1999, Pages 1997-2006

  Collins, R W ^a   Koh, Joohyun ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; MATRIX ALGEBRA; OPTICAL DESIGN; SPECTROMETERS; SPECTROSCOPY;

DUAL ROTATING-COMPENSATOR MULTICHANNEL ELLIPSOMETERS; MUELLER MATRIX SPECTROSCOPY;

ELLIPSOMETRY;

EID: 0032606398     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.16.001997     Document Type: Article

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