Spectroscopic Ellipsometry

Advanced Characterization Techniques for Thin Film Solar Cells

Volumn , Issue , 2011, Pages 125-149

  Marsillac, Sylvain ^a   Sestak, Michelle N ^a   Li, Jian ^a   Collins, Robert W ^a  

^a UNIVERSITY OF TOLEDO   (United States)

Author keywords

Film structure evolution; Hydrogenated amorphous si (a si:h); Hydrogenated nanocrystalline Si (Nc Si:H); Nucleation; Optical properties; Polycrystalline Cadmium Sulfide (Cds); Polycrystalline Cadmium telluride (Cdte); Spectroscopic ellipsometry; Thickness measurement; Thin films

Indexed keywords

EID: 84882616714     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/9783527636280.ch6     Document Type: Chapter

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