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Applied Physics Letters

Volumn 94, Issue 14, 2009, Pages

Electronic and structural properties of molybdenum thin films as determined by real-time spectroscopic ellipsometry

(6) Walker, J D a Khatri, H a Ranjan, V a Li, Jian a Collins, R W a Marsillac, S a

a UNIVERSITY OF TOLEDO (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AVERAGE GRAIN SIZES; BACK ELECTRODES; CONTACT LESS; CU(IN , GA)SE; ELECTRONIC AND STRUCTURAL PROPERTIES; FREE ELECTRONS; GRAIN STRUCTURES; NUCLEATION AND GROWTHS; OPTICAL FREQUENCIES; RADIO FREQUENCIES; REAL-TIME SPECTROSCOPIC ELLIPSOMETRIES; SODA-LIME GLASS SUBSTRATES; VOID VOLUME FRACTIONS;

COPPER COMPOUNDS; GALLIUM; GRAIN GROWTH; GRAIN SIZE AND SHAPE; LEAD; MOLYBDENUM; SEMICONDUCTING SELENIUM COMPOUNDS; SPECTROSCOPIC ELLIPSOMETRY; THIN FILMS; VOID FRACTION;

COPPER;

EID: 64349091308 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3117222 Document Type: Article

Times cited : (45)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.