Real-time spectroscopic ellipsometry of sputtered CdTe thin films: Effect of Ar pressure on structural evolution and photovoltaic performance

Materials Research Society Symposium Proceedings

Volumn 1165, Issue , 2010, Pages 393-398

  Sestak, Michelle N ^a   Li, Jian ^a   Paudel, Naba R ^a   Wieland, Kristopher A ^a   Chen, Jie ^a   Thornberry, Courtney ^a   Collins, Robert W ^a   Compaan, Alvin D ^a  

^a UNIVERSITY OF TOLEDO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON PRESSURE; CDTE; DATA SETS; DEPTH PROFILE; EX SITU; LAYER THICKNESS; LINEAR CORRELATION; MONOTONIC DECREASE; PHOTOVOLTAIC PERFORMANCE; POLYCRYSTALLINE; REAL TIME SPECTROSCOPIC ELLIPSOMETRY; ROOT MEAN SQUARES; STRUCTURAL EVOLUTION; STRUCTURAL UNIFORMITY; SUBSTRATE TEMPERATURE; VOID VOLUME FRACTION;

ARGON; ATOMIC FORCE MICROSCOPY; CADMIUM COMPOUNDS; COALESCENCE; DATA FLOW ANALYSIS; PHOTORESISTS; PRESSURE EFFECTS; SPECTROSCOPIC ELLIPSOMETRY; SURFACE PROPERTIES; SURFACE ROUGHNESS; VOID FRACTION;

CADMIUM ALLOYS;

EID: 77952067984     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

1. R. Messier, A.P. Giri, and R.A. Roy, J. Vac. Sci. Technol. A 2, 500 (1984).
2. V. Plotnikov, A. Vasko, A.D. Compaan, X. Liu, K. Wieland, R. Zeller, J. Li, and R.W. Collins, Mat. Res. Soc. Symp. Proc. (MRS, Warrendale PA, 2009), Vol. 1165, Art. No. 1165-M09-01.
3. J. Li, J.A. Stoke, N.J. Podraza, D. Sainju, A. Parikh, X. Cao, H. Khatri, N. Barreau, S. Marsillac, X. Deng, and R.W. Collins, in: Photovoltaic Cell and Module Technologies, edited by B. von Roedern and A.E. Delahoy, (SPIE, Bellingham, 2007), Vol. 6651, Art. No.6651-07.
4. D. E. Aspnes, Am. J. Phys. 50, 704 (1981).
5. J. Li, J. Chen, N.J. Podraza, and R. W. Collins, Conf. Record of the IEEE 4th World Conf. on Photovoltaic Energy Conversion 2006, (IEEE, Piscataway NJ, 2006) p. 392.
6. J. Lee, P.I. Rovira, I. An, and R.W. Collins, Rev. Sci. Instrum. 69, 1800 (1998).
7. B. Johs, J.A. Woollam, C.M. Herzinger, J.N. Hilfiker, R. Synowicki, and C. Bungay, Proc. Soc. Photo-Opt. Instrum. Eng., Crit. Rev. 72, 29 (1999).
8. X. Wu, P. Sheldon, Y. Mahathongdy, R. Ribelin, A. Mason, H.R. Moutinho, and T.J. Coutts, AIP Conf. Proc. 462, 37 (1999).
9. B. E. McCandless and J. R. Sites, in: Handbook of Photovoltaic Science and Engineering, edited by A. Luque and S. Hegedus, (John Wiley and Sons, 2003) p. 632.
10. G.A. Niklasson, C.G. Granqvist, and O. Hunderi, Appl. Opt. 20, 26 (1981).