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Volumn 5, Issue 5, 2008, Pages 1244-1248
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Spectroscopic ellipsometry studies of in2S3 top window and Mo back contacts in chalcopyrite photovoltaics technology
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Author keywords
[No Author keywords available]
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Indexed keywords
BACK CONTACT;
CDS;
CRITICAL POINTS;
DRUDE RELAXATION;
EX SITU;
IN-SITU;
PHOTOVOLTAICS;
SOLAR CELL PERFORMANCE;
WINDOW LAYER;
CADMIUM COMPOUNDS;
CADMIUM SULFIDE;
COPPER COMPOUNDS;
EQUATIONS OF STATE;
MAGNETRONS;
PHOTOVOLTAIC EFFECTS;
SILICON SOLAR CELLS;
SPECTROSCOPIC ELLIPSOMETRY;
SPONTANEOUS EMISSION;
MOLYBDENUM;
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EID: 57049136597
PISSN: 18626351
EISSN: 16101642
Source Type: Journal
DOI: 10.1002/pssc.200777889 Document Type: Conference Paper |
Times cited : (37)
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References (9)
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