Analysis and optimization of thin film photovoltaic materials and device fabrication by real time spectroscopic ellipsometry

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6651, Issue , 2007, Pages

  Li, Jian ^a   Stoke, Jason A ^a   Podraza, Nikolas J ^a,b   Sainju, Deepak ^a   Parikh, Anuja ^a   Cao, Xinmin ^a   Khatri, Himal ^a   Barreau, Nicolas ^c   Marsillac, Sylvain ^a   Deng, Xunming ^a   Collins, Robert W ^a  

^a UNIVERSITY OF TOLEDO   (United States)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

^c UNIVERSITÉ DE NANTES   (France)

Author keywords

a Si:H; CdS; CdTe; CdTe1 xSx; Ellipsometry; Photovoltaic devices; Photovoltaic materials; Photovoltaics; Real time spectroscopic ellipsometry (RTSE); Solar cells; Spectroscopic ellipsometry (SE); Thin films

Indexed keywords

PHASE DIAGRAMS; PHOTOVOLTAIC CELLS; SPECTROSCOPIC ELLIPSOMETRY; THIN FILMS;

PHOTOVOLTAIC MATERIALS; REAL TIME SPECTROSCOPIC ELLIPSOMETRY (RTSE);

SOLAR CELLS;

EID: 42149163922     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.736362     Document Type: Conference Paper

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