Method for local temperature measurement in a nanoreactor for in situ high-resolution electron microscopy

Ultramicroscopy

Volumn 133, Issue , 2013, Pages 72-79

  Vendelbo, S B ^a   Kooyman, P J ^a   Creemer, J F ^b   Morana, B ^b   Mele, L ^b,c   Dona, P ^c   Nelissen, B J ^d   Helveg, S ^e  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^c Thermo Fisher Scientific   (United States)

^d Albemarle Corporation   (United States)

^e HALDOR TOPSØE A S   (Denmark)

Author keywords

Ambient conditions; Electron energy loss spectroscopy; Heat transfer; In situ TEM; Nanoreactor; Temperature

Indexed keywords

AMBIENT CONDITIONS; ELEVATED TEMPERATURE; GLOBAL TEMPERATURES; IN-SITU TEM; LOCAL TEMPERATURE MEASUREMENTS; PROCESS PARAMETERS; SITU HIGH-RESOLUTION ELECTRON MICROSCOPIES; SPATIAL CONFINEMENT;

DENSITY OF GASES; ELECTROMECHANICAL DEVICES; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; HEAT TRANSFER; MEMS; TEMPERATURE; TEMPERATURE MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY;

NANOREACTORS;

ARTICLE; DENSITY; ELECTRON BEAM; ELECTRON ENERGY LOSS SPECTROSCOPY; GAS; IN SITU HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MICROELECTROMECHANICAL SYSTEM; MONITORING; NANOREACTOR; PREDICTION; PRESSURE; TEMPERATURE MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY;

AMBIENT CONDITIONS; ELECTRON ENERGY LOSS SPECTROSCOPY; HEAT TRANSFER; IN-SITU TEM; NANOREACTOR; TEMPERATURE;

ELECTRONS; GASES; MICROSCOPY, ELECTRON; MICROSCOPY, ELECTRON, TRANSMISSION; SPECTROSCOPY, ELECTRON ENERGY-LOSS; TEMPERATURE;

EID: 84882606869     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2013.04.004     Document Type: Article

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