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Volumn 54, Issue 6, 2005, Pages 505-508

Development of a technique for high resolution electron microscopic observation of nano-materials at elevated temperatures

Author keywords

Atoms; Carbon film; Gold nano particles; High resolution transmission electron microscopy; High temperature; Nano materials; Specimen heating holder; Zns

Indexed keywords

CARBON FILMS; ELECTRONS; GOLD; II-VI SEMICONDUCTORS; NANOPARTICLES; TUNGSTEN; ZINC SULFIDE;

EID: 33645986991     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dfi072     Document Type: Article
Times cited : (15)

References (8)
  • 1
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    • (1993) Microsc. Microanal. Microstruct. , vol.4 , pp. 127-135
    • Kamino, T.1    Saka, H.2
  • 2
    • 0000961035 scopus 로고
    • In situ study of chemical reaction between silicon and graphite at 1400 K in a high resolution/analytical transmission electron microscope
    • Kamino T, Yaguchi T, and Saka H (1994) In situ study of chemical reaction between silicon and graphite at 1400 K in a high resolution/analytical transmission electron microscope. J. Electron Microsc. 43: 104-110.
    • (1994) J. Electron Microsc. , vol.43 , pp. 104-110
    • Kamino, T.1    Yaguchi, T.2    Saka, H.3
  • 3
    • 0029231892 scopus 로고
    • Dynamic observation of in situ sintering of SiC crystals at near atomic resolution
    • Kamino T, Yaguchi T, Ukiana M, Yasutomi Y, and Saka H (1995) Dynamic observation of in situ sintering of SiC crystals at near atomic resolution. Mater. Trans. JIM 6: 73-75.
    • (1995) Mater. Trans. JIM , vol.6 , pp. 73-75
    • Kamino, T.1    Yaguchi, T.2    Ukiana, M.3    Yasutomi, Y.4    Saka, H.5
  • 5
    • 0033276763 scopus 로고    scopus 로고
    • High resolution in situ electron microscopy of a silicon surface modification by molten aluminum at high temperature
    • Tsukimoto S, Arai S, and Saka H (1999) High resolution in situ electron microscopy of a silicon surface modification by molten aluminum at high temperature. Phil. Mag. Lett. 79: 913-918.
    • (1999) Phil. Mag. Lett. , vol.79 , pp. 913-918
    • Tsukimoto, S.1    Arai, S.2    Saka, H.3
  • 6
    • 0032869995 scopus 로고    scopus 로고
    • High-resolution in situ transmission electron microscopy observation of a solid-liquid interface in the Al-Si system
    • Arai S, Tsukimoto S, Miyai H, and Saka H (1999) High-resolution in situ transmission electron microscopy observation of a solid-liquid interface in the Al-Si system. J. Electron Microsc. 48: 317-321.
    • (1999) J. Electron Microsc. , vol.48 , pp. 317-321
    • Arai, S.1    Tsukimoto, S.2    Miyai, H.3    Saka, H.4
  • 7
    • 0039001980 scopus 로고    scopus 로고
    • Direct observation of the atomic structure in a solid-liquid interface
    • Arai S, Tsukimoto S, Muto S, and Saka H (2000) Direct observation of the atomic structure in a solid-liquid interface. Microsc. Microanal. 6: 358-361.
    • (2000) Microsc. Microanal. , vol.6 , pp. 358-361
    • Arai, S.1    Tsukimoto, S.2    Muto, S.3    Saka, H.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.