Electron thermal microscopy

Nano Letters

Volumn 8, Issue 2, 2008, Pages 582-585

  Brintlinger, Todd ^a,b   Qi, Yi ^a   Baloch, Kamal H ^b   Goldhaber Gordon, David ^c   Cumings, John ^a,c  

^a UNIVERSITY OF MARYLAND   (United States)

^b UNIVERSITY OF MARYLAND   (United States)

^c STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON THERMAL MICROSCOPY; OPTICAL EFFECTS;

COMPUTER INTEGRATED MANUFACTURING; PHASE TRANSITIONS; SILICON NITRIDE; THERMAL GRADIENTS;

TRANSMISSION ELECTRON MICROSCOPY;

METAL; NANOMATERIAL;

ARTICLE; CHEMICAL MODEL; CHEMICAL STRUCTURE; CHEMISTRY; COMPUTER SIMULATION; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; THERMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY; ULTRASTRUCTURE;

COMPUTER SIMULATION; MATERIALS TESTING; METALS; MICROSCOPY, ELECTRON, TRANSMISSION; MODELS, CHEMICAL; MODELS, MOLECULAR; NANOSTRUCTURES; NANOTECHNOLOGY; PARTICLE SIZE; THERMOGRAPHY;

EID: 40449092663     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl0729375     Document Type: Article

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