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Volumn 13, Issue 8, 2013, Pages 3576-3580

Direct imaging of charged impurity density in common graphene substrates

Author keywords

charge inhomogeneity; charged impurity scattering; Graphene; Kelvin probe force microscopy; noncontact atomic force microscopy

Indexed keywords

CHARGE DENSITY FLUCTUATIONS; CHARGED IMPURITY SCATTERINGS; ELECTROSTATIC POTENTIAL FLUCTUATIONS; HEXAGONAL BORON NITRIDE (H-BN); INHOMOGENEITIES; KELVIN PROBE FORCE MICROSCOPY; KELVIN PROBE MICROSCOPY; NONCONTACT ATOMIC FORCE MICROSCOPY;

EID: 84881593348     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl4012529     Document Type: Article
Times cited : (83)

References (48)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.