Tuning the effective fine structure constant in graphene: Opposing effects of dielectric screening on short- and long-range potential scattering

Physical Review Letters

Volumn 101, Issue 14, 2008, Pages

  Jang, C ^a   Adam, S ^b   Chen, J H ^a   Williams, E D ^a   Das Sarma, S ^a,b   Fuhrer, M S ^a  

^a UNIVERSITY OF MARYLAND   (United States)

^b UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; ELECTRONS; FLOW INTERACTIONS; HOLE MOBILITY; VACUUM;

BACKGROUND DIELECTRIC CONSTANT; CONDUCTION ELECTRONS; DENSITY-INDEPENDENT; DIELECTRIC SCREENING; ELECTRON HOLES; EXPERIMENTAL DATA; FINE STRUCTURE CONSTANTS; GRAPHENE; IMPURITY POTENTIAL; IMPURITY SCATTERING; INTERACTION STRENGTHS; LONG-RANGE POTENTIAL;

IMPURITIES;

EID: 53549085391     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.101.146805     Document Type: Article

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