Analysis of deformation structures in FCC materials using EBSD and TEM techniques

Electron Backscatter Diffraction in Materials Science

Volumn , Issue , 2009, Pages 263-275

  Mishin, Oleg V ^a   Godfrey, Andrew ^b   Jensen, Dorte Juul ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^b TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84881085474     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1007/978-0-387-88136-2_19     Document Type: Chapter

References (31)

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