Characterisation of orientation noise during EBSP investigation of deformed samples

Materials Science Forum

Volumn 408-412, Issue I, 2002, Pages 221-226

  Godfrey, A ^a   Wu, G L ^a   Liu, Q ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

Deformation Microstructures; EBSP EBSD; Orientation Noise

Indexed keywords

DATA REDUCTION; DEFORMATION; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON BACK SCATTER PATTERN (EBSP); ORIENTATION NOISE;

CRYSTAL ORIENTATION;

EID: 0036947184     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.408-412.221     Document Type: Conference Paper

References (6)

1. F.J. Humphreys: J. Microsc. Vol. 195 (1999), p. 170.
2. F.J. Humphreys, Y. Huang, I. Brough I. and C Harris: J. Microsc. Vol. 195 (1999), p.212.
3. F.J. Humphreys and I. Brough: J. Microsc. Vol. 195 (1999), p.6.
4. M.C. Demirel, B.S. El-Dasher, B.L. Adams and A.D. Rollett: Electron Backscatter Diffraction in Materials Science ch.6, ed. A.J. Schwartz et al. (Kluwer Academic, Boston 2000).
5. C. Bingham: Ann. Stat. Vol. 2 (1974), p.1201.
6. W. Pantleon: Acta mater. Vol. 49 (2001), p.1479.