Processing and interpretation of EBSD data gathered from plastically deformed metals

Materials Science and Technology

Volumn 22, Issue 11, 2006, Pages 1263-1270

  Godfrey, A ^a   Mishin, O V ^b   Liu, Q ^a  

^a TSINGHUA UNIVERSITY   (China)

^b Sapa Technology   (Sweden)

Author keywords

Angular resolution; Dislocation boundary; EBSD; Orientation noise

Indexed keywords

BACKSCATTERING; DISLOCATIONS (CRYSTALS); MICROSTRUCTURE; OPTICAL RESOLVING POWER;

ANGULAR RESOLUTION; DISLOCATION BOUNDARY MICROSTRUCTURES; ELECTRON BACKSCATTERED DIFFRACTION (EBSD); ORIENTATION NOISE;

ELECTRON DIFFRACTION;

EID: 33751352938     PISSN: 02670836     EISSN: None     Source Type: Journal    
DOI: 10.1179/174328406X130911     Document Type: Article

References (18)

1. B. Bay, N. Hansen, D. A. Hughes and D. Kuhlmann-Wilsdorf: Acta Metall. Mater., 1992, 40, 205-219.
2. D. A. Hughes, Q. Liu, D. C. Chrzan and N. Hansen: Acta Mater., 1997, 45, 105-112.
3. Q. Liu, D. Juul Jensen and N. Hansen: Acta Mater., 1998, 20, 1-19.
4. N. Hansen and D. Juul Jensen: Philos. Trans. Res Soc. Land. A, 1999, 357A, 1447-1469.
5. F. J. Humphreys, Y. Huang, I. Brough and C. Harris: J. Microsc., 1999, 195, 212-216.
6. F. J. Humphreys and I. Brough: J. Microsc., 1999, 195, 6-9.
7. F. J. Humphreys, P. Bate and P. J. Hurley: J. Microsc., 2001, 201, 50-58.
8. A. Godfrey: Scr. Mater., 2004, 50, 1097-1101.
9. D. A. Hughes and N. Hansen: Acta Mater., 2000, 48, 2985-3004.
10. A. Godfrey, G. L. Wu and Q. Liu: Mater. Sci. Forum, 2002, 408-412, 221-226.
11. M. C. Demirel, B-S. El-Dasher, B. L. Adams and A. D. Rollett: in "Electron backscatter diffraction in materials science', (ed. A. J. Schwartz et al.), Chap. 6, 65; 2000, Boston, Kluwer Academic.
12. N. C. Krieger Lassen, D. Juul Jensen and K. Conradsen: Acta Cryst. A, 1994, 50A, 741-748.
13. C. Bingham: Ann. Stat., 1974, 2, 1201-1225.
14. A. Morawiec: 'Orientations and rotations: computations in crystallographic textures', Chap. 5; 2000, Berlin, Springer-Verlag.
15. W. Pantleon and N. Hansen: Acta Mater., 2001, 49, 1479-1493.
16. Q. Liu: Ultramicroscopy, 1995, 60, 81-89.
17. O. V. Mishin, A. Godfrey and L. Östensson: Metall. Mater. Trans. A, 2006, 37A, 498-496.
18. W. Q. Cao, A. Godfrey and Q. Liu: J. Microsc., 2003, 211, 219-229.