SCOPUS 정보 검색 플랫폼

Volumn 195, Issue 1, 1999, Pages 6-9

High resolution electron backscatter diffraction with a field emission gun scanning electron microscope

a UNIVERSITY OF MANCHESTER (United Kingdom)

Author keywords

Angular accuracy; Angular resolution; EBSD; Electron backscatter diffraction; FEGSEM; High resolution; SEM; Spatial resolution

Indexed keywords

BACKSCATTERING; ELECTRON DIFFRACTION; ELECTRONS; FIELD EMISSION; IMAGE RESOLUTION; PROBES;

ANGULAR ACCURACY; ANGULAR RESOLUTION; EBSD; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION; FEG-SEM; HIGH RESOLUTION; HIGH RESOLUTION ELECTRON BACKSCATTER DIFFRACTIONS; PROBE CURRENTS; SPATIAL RESOLUTION;

SCANNING ELECTRON MICROSCOPY;

ARTICLE; ELECTRON DIFFRACTION; IMAGE ENHANCEMENT; IMAGE PROCESSING; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY;

EID: 0032839620 PISSN: 00222720 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (69)

References (8)

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3
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4
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- Quantitative metallography by electron backscaltered diffraction
- in press
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- Humphreys, F.J.¹

5
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- EBSD of grain and subgrain structures - Resolution considerations
- in press
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6
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8
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.