Electron backscatter diffraction of grain and subgrain structures - Resolution considerations

Journal of Microscopy

Volumn 195, Issue 3, 1999, Pages 212-216

  Humphreys, F J ^a   Huang, Y ^a   Brough, I ^a   Harris, C ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

Angular resolution; EBSD; FEGSEM; Grain; SEM; Spatial resolution subgrains

Indexed keywords

ELECTRON DIFFRACTION; GRAIN BOUNDARIES; IMAGE RESOLUTION; PROBES; SCANNING ELECTRON MICROSCOPY;

ANGULAR RESOLUTION; ELECTRON BACK-SCATTERED DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION; FEG-SEM; PROBE CURRENTS; SCANNING ELECTRON MICROSCOPE; SCANNING ELECTRONS; SPATIAL RESOLUTION; SPATIAL RESOLUTION SUBGRAIN; SUBGRAINS;

MICROSTRUCTURE;

ALUMINUM; TUNGSTEN;

ACCURACY; ELECTRON DIFFRACTION; IMAGE PROCESSING; OPTICAL RESOLUTION; ORIENTATION; PRIORITY JOURNAL; REVIEW; SCANNING ELECTRON MICROSCOPY;

EID: 0032831195     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1999.00579.x     Document Type: Review

References (8)

1. Dingley, D.J. & Field, D.P. (1997) Electron backscattered diffraction and orientation imaging. Mater. Sci. Technol. 13, 69-78.
2. Farstad, O., Johannessen, K. & Hjelen, J. (1998) Spatial resolution of EBSD using fully automated pattern indexing. Proc. ICEM 14, Mexico, Vol. III (eds H. A. Calderón Benavides and M. José Yacamán), pp. 753-754. Institute of Physics Publishing, Bristol.
3. Humphreys, F.J. (1999) Quantitative metallography by electron backscattered diffraction. J. Microsc. 195, 170-185.
4. Krieger Lassen, N.C., Juul Jensen, D. & Conradsen, K. (1992) Image processing procedures for analysis of electron backscatter patterns. Scanning Microsc. 6, 115-121.
5. Pettersen, T., Heiberg, G. & Hjelen, J. (1998) Measurements of spatial resolution of EBSD in the SEM as a function of atomic number and high voltage. Proc. ICEM 14, Mexico, Vol. III (eds H. A. Calderón Benavides and M. José Yacamán), pp. 775-776. Institute of Physics Publishing. Bristol.
6. Randle, V. (1992) Microtexture Determination. Institute of Materials, London.
7. Wright, S.I. & Adams, B.L. (1992) Automated analysis of electron backscatter patterns. Metall. Trans. 23A, 759-767.
8. Wright, S.I. & Kocks, U.F. (1996) A comparison of different texture analysis techniques. Proceedings 11th Int. Conference on Texture. Xian, Vol. 1 (eds Z. Liang, L. Zuo and Y. Chu), pp. 53-62, International Academic Publishers, Beijing.