Orientation averaging of electron backscattered diffraction data

Journal of Microscopy

Volumn 201, Issue 1, 2001, Pages 50-58

  Humphreys, F J ^a   Bate, P S ^a   Hurley, P J ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

Angular resolution; EBSD; Orientation averaging; Scanning electron microscopy

Indexed keywords

DATA HANDLING; ELECTRON DIFFRACTION;

ANGULAR RESOLUTION; DATA AVERAGING; DIFFRACTION DATA; EDGE-PRESERVING FILTER; ELECTRON BACK-SCATTERED DIFFRACTION; EULER SYMMETRIC PARAMETERS; ORIENTATION AVERAGING; QUATERNION REPRESENTATION; SUBGRAIN MISORIENTATION; THREE-PASS;

SCANNING ELECTRON MICROSCOPY;

ALLOY; ALUMINUM;

ACCURACY; ARTICLE; FILTER; MATHEMATICAL ANALYSIS; OPTICAL RESOLUTION; PRIORITY JOURNAL; QUANTITATIVE ASSAY; SCANNING ELECTRON MICROSCOPY;

EID: 0035130725     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2001.00777.x     Document Type: Article

References (17)

1. Orientation mapping
2. Determination of a mean orientation from a cloud of orientations. Application to EBSD
3. Quantitative metallography by electron backscattered diffraction
4. Microstructural characterisation by high resolution EBSD in the FEGSEM - Competition for the TEM?
5. High resolution electron backscatter diffraction with a field emission gun scanning electron microscope
6. Orientation representation on the 4-d unit sphere. The analagon of the 3-d pole sphere
7. On the statistical analysis of orientation data
8. Processing of radio-isotope angiocardiographic images
9. Problems in determining the misorientation axes for small angular misorientations using EBSD
10. The application of EBSD and orientation contrast imaging in the SEM to textural problems in rocks
11. Orientation contrast imaging of microstructures in rocks using forescatter detectors in the SEM
12. Measuring the influence of grain boundary misorientation groove geometry in ceramic polycrystals
13. Electron diffraction based techniques in scanning electron microscopy of bulk materials
14. Automated analysis of electron backscatter patterns