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Volumn , Issue , 2013, Pages 222-233

Coset coding to extend the lifetime of memory

Author keywords

[No Author keywords available]

Indexed keywords

COSET CODING; LIFETIME RELIABILITY; MEMORY TECHNOLOGY; ONE-TO-MANY MAPPING; PHASE CHANGE MEMORY (PCM); WRITE OPERATIONS;

EID: 84880310473     PISSN: 15300897     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/HPCA.2013.6522321     Document Type: Conference Paper
Times cited : (98)

References (30)
  • 1
    • 0024754832 scopus 로고
    • Coding for write-efficient memory
    • Oct
    • R. Ahlswede and Z. Zhang, "Coding for Write-Efficient Memory," Information and Computation, vol. 83, no. 1, pp. 80-97, Oct. 1989.
    • (1989) Information and Computation , vol.83 , Issue.1 , pp. 80-97
    • Ahlswede, R.1    Zhang, Z.2
  • 5
    • 76749099329 scopus 로고    scopus 로고
    • Flip-n-write: A simple deterministic technique to improve pram write performance, energy and endurance
    • S. Cho and H. Lee, "Flip-N-Write: A Simple Deterministic Technique to Improve PRAM Write Performance, Energy and Endurance," in Proceedings of the 42nd Annual Int'l Symp. on Microarchitecture, 2009.
    • (2009) Proceedings of the 42nd Annual Int'l Symp. on Microarchitecture
    • Cho, S.1    Lee, H.2
  • 6
    • 84945713988 scopus 로고
    • Coset codes. i. introduction and geometrical classification
    • Sep
    • G. D. Forney, "Coset Codes. I. Introduction and Geometrical Classification," IEEE Trans. Information Theory, 34(5), Sep. 1988.
    • (1988) IEEE Trans. Information Theory , vol.34 , Issue.5
    • Forney, G.D.1
  • 7
    • 84941860379 scopus 로고
    • Coset codes. II. binary lattices and related codes
    • Sep
    • G. D. Forney, "Coset Codes. II. Binary Lattices and Related Codes," IEEE Trans. Information Theory, 34(5), Sep. 1988.
    • (1988) IEEE Trans. Information Theory , vol.34 , Issue.5
    • Forney, G.D.1
  • 17
    • 84880276874 scopus 로고    scopus 로고
    • P8P parallel phase change memory (pcm) np8p128a13b1760e
    • Micron Technology, Inc
    • Micron Technology, Inc., "P8P Parallel Phase Change Memory (PCM) NP8P128A13B1760E." Micron, 2005.
    • (2005) Micron
  • 22
    • 9144245836 scopus 로고
    • A class of multiple-error-correcting codes and the decoding scheme
    • Sep
    • I. Reed, "A Class of Multiple-Error-Correcting Codes and the Decoding Scheme," IRE Professional Group on Information Theory, vol. 4, no. 4, pp. 38-49, Sep. 1954.
    • (1954) IRE Professional Group on Information Theory , vol.4 , Issue.4 , pp. 38-49
    • Reed, I.1
  • 24
    • 77954961189 scopus 로고    scopus 로고
    • Security refresh: Prevent malicious wear-out and increase durability for phase-change memory with dynamically randomized address mapping
    • N. H. Seong, D. H. Woo, and H.-H. S. Lee, "Security Refresh: Prevent Malicious Wear-Out and Increase Durability for Phase-Change Memory with Dynamically Randomized Address Mapping," in Proc. 37th Int'l Symp. on Computer Architecture, 2010.
    • (2010) Proc. 37th Int'l Symp. on Computer Architecture
    • Seong, N.H.1    Woo, D.H.2    Lee, H.-H.S.3
  • 29
    • 70450277571 scopus 로고    scopus 로고
    • A durable and energy efficient main memory using phase change memory technology
    • P. Zhou et al., "A Durable and Energy Efficient Main Memory Using Phase Change Memory Technology," in Proc. 36th Int'l Symp. on Computer Architecture, 2009.
    • (2009) Proc. 36th Int'l Symp. on Computer Architecture
    • Zhou, P.1
  • 30
    • 4244057196 scopus 로고    scopus 로고
    • International Technology Roadmap for Semiconductors, 2007 Edition
    • International Technology Roadmap for Semiconductors, 2007 Edition, Process Integration, Devices, and Structures. 2007.
    • (2007) Process Integration, Devices, and Structures


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.