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Volumn , Issue , 2010, Pages 3-14

Dynamically replicated memory: Building reliable systems from nanoscale resistive memories

Author keywords

Phase change memory; Write endurance

Indexed keywords

CACHE HIERARCHIES; DEEP SUB-MICRON; ERROR-DETECTION TECHNIQUES; GRACEFUL DEGRADATION; MEMORY CONTROLLER; MEMORY PAGES; NANO SCALE; OPERATING SYSTEM INTERFACES; OPERATING SYSTEMS; PAGE TABLE; PROCESSOR CORES; RELIABLE SYSTEMS; TEM;

EID: 77952268480     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1736020.1736023     Document Type: Conference Paper
Times cited : (123)

References (33)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.