Where does the current flow in two-dimensional layered systems?

Nano Letters

Volumn 13, Issue 7, 2013, Pages 3396-3402

  Das, Saptarshi ^a   Appenzeller, Joerg ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

2D materials; charge screening; contact resistance; current transport; FET; MoS2

Indexed keywords

CHARGE SCREENING; CONVENTIONAL MODELS; CURRENT DISTRIBUTION; CURRENT TRANSPORT; ELECTRONICS COMPONENTS; FET; MOS2; TWO-DIMENSIONAL SYSTEMS;

CONTACT RESISTANCE; ELECTRIC CURRENT DISTRIBUTION MEASUREMENT; FIELD EFFECT TRANSISTORS; GRAPHENE; MULTILAYERS; TWO DIMENSIONAL;

MOLYBDENUM COMPOUNDS;

EID: 84880179070     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl401831u     Document Type: Article

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