메뉴 건너뛰기




Volumn 5, Issue 13, 2013, Pages 6108-6112

Chemical stability and electrical performance of dual-active-layered zinc-tin-oxide/indium-gallium-zinc-oxide thin-film transistors using a solution process

Author keywords

dual active layered zinc tin oxide indium gallium zinc oxide; etch stopper layer; self protection layer; thin film transistors; wet etch

Indexed keywords

ETCH-STOPPER-LAYER; SELF-PROTECTION LAYER; THIN-FILM TRANSISTOR (TFTS); WET-ETCH; ZINC-TIN-OXIDE (ZTO);

EID: 84880061451     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am400943z     Document Type: Article
Times cited : (67)

References (33)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.