Shape-independent lateral force calibration

ACS Applied Materials and Interfaces

Volumn 3, Issue 9, 2011, Pages 3256-3260

  Anderson, Evan V ^a   Chakraborty, Saonti ^a   Esformes, Taylor ^a   Eggiman, Derek ^a   Degraf, Colin ^a   Stevens, Keeley M ^a   Liu, Deli ^a   Burnham, Nancy A ^a  

^a WORCESTER POLYTECHNIC INSTITUTE   (United States)

Author keywords

calibration; force microscopy; friction; nanocharacterization; tribology

Indexed keywords

COMMON PROBLEMS; FORCE MICROSCOPY; LATERAL FORCE CALIBRATION; LINEAR RELATIONSHIPS; NANO-CHARACTERIZATION; QUANTITATIVE COMPARISON;

FRICTION; TRIBOLOGY;

CALIBRATION;

ARTICLE; ATOMIC FORCE MICROSCOPY; CALIBRATION; METHODOLOGY; NANOTECHNOLOGY; STANDARD;

CALIBRATION; MICROSCOPY, ATOMIC FORCE; NANOTECHNOLOGY;

EID: 84879791606     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am200770r     Document Type: Article

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