Spatially resolved silicon solar cell characterization using infrared imaging methods

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2008, Pages

  Kasemann, M ^a,b   Kwapil, W ^a   Schubert, M C ^a   Habenicht, H ^a   Walter, B ^a   The, M ^a   Kontermann, S ^a   Rein, S ^a   Breitenstein, O ^c   Bauer, J ^c   Lotnyk, A ^c   Michl, B ^d   Nagel, H ^d   Schutt, A ^e   Carstensen, J ^e   Foll, H ^e   Trupke, T ^f   Augarten, Y ^f   Kampwerth, H ^f   Bardos, R A ^g   Pingel, S ^h   Berghold, J ^h   Warta, W ^a   Glunz, S W ^a   more..

^a FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

^b UNIVERSITY OF FREIBURG   (Germany)

^c MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^d SCHOTT Solar GmbH   (Germany)

^e UNIVERSITY OF KIEL   (Germany)

^f UNIVERSITY OF NEW SOUTH WALES   (Australia)

^g BT Australasia Pty Ltd   (Australia)

^h Solon AG für Solartechnik   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

MEASUREMENT TIME; METHOD DEVELOPMENT; MULTICRYSTALLINE; QUANTITATIVE METHOD; REVERSE VOLTAGES; SERIES RESISTANCES; SILICON SOLAR CELL CHARACTERIZATION; SPATIALLY RESOLVED;

DAMAGE DETECTION; ELECTRIC RESISTANCE; INFRARED IMAGING;

SILICON SOLAR CELLS;

EID: 84879732589     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2008.4922478     Document Type: Conference Paper

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