Fast, contactless and spatially resolved measurement of sheet resistance by an infrared method

Progress in Photovoltaics: Research and Applications

Volumn 12, Issue 7, 2004, Pages 539-552

  Isenberg, Joerg ^a   Biro, Daniel ^a   Warta, Wilhelm ^a  

^a FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

Author keywords

Four point probing; Free carrier absorption; IR measurement methods; Selective emitter; Sheet resistance; Solar cell characterization

Indexed keywords

ABSORPTION; CAMERAS; CHARGE COUPLED DEVICES; INFRARED RADIATION; METALLIZING; SEMICONDUCTOR DEVICES;

FOUR-POINT PROBING; FREE CARRIER ABSORPTION; IR MEASUREMENT METHODS; SELECTIVE EMITTER; SHEET RESISTANCE IMAGING (SRI); SOLAR CELL CHARACTERIZATION;

SILICON SOLAR CELLS;

EID: 6044230802     PISSN: 10627995     EISSN: None     Source Type: Journal    
DOI: 10.1002/pip.548     Document Type: Article

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