Imaging method for laterally resolved measurement of minority carrier densities and lifetimes: Measurement principle and first applications

Journal of Applied Physics

Volumn 93, Issue 7, 2003, Pages 4268-4275

  Isenberg, Joerg ^a   Riepe, Stephan ^a   Glunz, Stefan W ^a   Warta, Wilhelm ^a  

^a FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; CARRIER CONCENTRATION; CHARGE COUPLED DEVICES; INFRARED RADIATION; LIGHT ABSORPTION; SILICON WAFERS;

FREE CARRIERS;

IMAGING SYSTEMS;

EID: 0037391034     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1555688     Document Type: Article

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