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Volumn 87, Issue 24, 2013, Pages

Optimizing atomic resolution of force microscopy in ambient conditions

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EID: 84879010688     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.87.245415     Document Type: Article
Times cited : (60)

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