Indirect modulation of nonmagnetic probes for force modulation atomic force microscopy

Analytical Chemistry

Volumn 81, Issue 4, 2009, Pages 1699-1706

  Li, Jie Ren ^a   Garno, Jayne C ^a  

^a LOUISIANA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ATOMIC FORCES; CONTACT IMAGING; DRIVING FREQUENCIES; DYNAMIC PARAMETERS; ELASTIC RESPONSE; FORCE MODULATIONS; FREQUENCY DEPENDENTS; IMAGING MODES; INDIRECT MODULATIONS; INSTRUMENT SETUPS; MAGNETIC COATINGS; MAGNETIC MODULATIONS; NON-MAGNETIC; ORGANOSILANE; PERIODIC OSCILLATIONS; RING PATTERNS; SET-POINTS; SPRING CONSTANTS; TEST PLATFORMS; WIRE-COILS;

DYNAMIC RESPONSE; ELECTROMAGNETIC FIELDS; FERROMAGNETIC MATERIALS; FREQUENCY RESPONSE; MODULATION; NANOCANTILEVERS; SILANES;

ATOMIC FORCE MICROSCOPY;

ARTICLE; ATOMIC FORCE MICROSCOPY; IMAGE ANALYSIS; IMAGE INTENSIFIER; IMAGE QUALITY; OSCILLATION; CHEMISTRY; ELECTROMAGNETIC FIELD; MAGNETISM; MECHANICS; METHODOLOGY; REPRODUCIBILITY; SURFACE PROPERTY; VIBRATION;

MACROGOL DERIVATIVE; ORGANOSILICON DERIVATIVE; SILANE DERIVATIVE;

ELECTROMAGNETIC FIELDS; MAGNETICS; MECHANICAL PROCESSES; MICROSCOPY, ATOMIC FORCE; ORGANOSILICON COMPOUNDS; POLYETHYLENE GLYCOLS; REPRODUCIBILITY OF RESULTS; SILANES; SURFACE PROPERTIES; VIBRATION;

EID: 63649115804     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac802143g     Document Type: Article

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