XEDS STEM tomography for 3D chemical characterization of nanoscale particles

Ultramicroscopy

Volumn 131, Issue , 2013, Pages 24-32

  Genc, Arda ^a   Kovarik, Libor ^b   Gu, Meng ^b   Cheng, Huikai ^a   Plachinda, Paul ^a   Pullan, Lee ^a   Freitag, Bert ^a   Wang, Chongmin ^b  

^a Thermo Fisher Scientific   (United States)

^b PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

Author keywords

3D chemical mapping; Li ion battery; Li1.2Ni0.2Mn0.6O2; Silicon drift detector; STEM; Tomography; XEDS

Indexed keywords

CHEMICAL MAPPING; LI-ION BATTERIES; SILICON DRIFT DETECTOR; STEM; XEDS;

ATOMS; CATHODES; CHARACTERIZATION; LITHIUM; MANGANESE; MATERIALS; NANOPARTICLES; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; NICKEL; STRENGTH OF MATERIALS; SURFACE SEGREGATION; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY;

THREE DIMENSIONAL COMPUTER GRAPHICS;

LITHIUM ION; MANGANESE; NANOPARTICLE; NICKEL; OXYGEN;

ARTICLE; ATOMIC NUMBER; CATHODE; CHEMICAL ANALYSIS; CHEMICAL PARAMETERS; CHEMICAL STRUCTURE; CONTROLLED STUDY; ELECTRIC BATTERY; ELECTRODE; IMAGE RECONSTRUCTION; INTERMETHOD COMPARISON; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SURFACE PROPERTY; THREE DIMENSIONAL IMAGING; X RAY SPECTROMETRY;

EID: 84877796526     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2013.03.023     Document Type: Article

References (23)

1. Arslan I., Yates T.J.V., Browning N.D., Midgley P.A. Embedded nanostructures revealed in three dimensions. Science 2005, 309:2195-2198.
2. Midgley P.A., Weyland M. 3D electron microscopy in the physical sciences: the development of Z-contrast and EFTEM tomography. Ultramicroscopy 2003, 96:413-431.
3. Weyland M., Midgley P.A., Yates T.J.V., Arslan I., Dunin-Borkowski R.E., Thomas J.M. Nanoscale scanning transmission electron tomography. Journal of Microscopy 2006, 223:185-190.
4. Weyland M., Midgley P.A., Thomas J.M. Z-contrast tomography: a technique in three dimensional nanostructural analysis based on Rutherford scattering. Chemical Communications 2001, 907-908.
5. Weyland M., Midgley P.A., Thomas J.M. Electron tomography of nanoparticle catalysts on porous supports: a new technique based on Rutherford scattering. Journal of Physical Chemistry B 2001, 105:7882-7886.
6. Ortalan V., Herrera M., Morgan D.G., Browning N.D. Application of image processing to STEM tomography of low-contrast materials. Ultramicroscopy 2009, 110:67-81.
7. Aronova M.A., Kim Y.C., Harmon R., Sousa A.A., Zhang G., Leapman R.D. Three-dimensional elemental mapping of phosphorus by quantitative electron spectroscopic tomography (QuEST). Journal of Structural Biology 2008, 161:322-353.
8. Jarausch K., Thomas P., Leonard D.N., Twesten R., Booth C.R. Four-dimensional STEM-EELS: enabling nano-scale chemical tomography. Ultramicroscopy 2009, 109:326-337.
9. Yaguchi T., Konno M., Kamino T., Watanabe M. Observation of three-dimensional elemental distributions of a Si device using a 360°-tilt FIB and the cold field-emission STEM system. Ultramicroscopy 2008, 108:1603-1615.
10. Mobus G., Doole R.C., Inkson B.J. Spectroscopic electron tomography. Ultramicroscopy 2003, 96:433-451.
11. Yedra L., Eljarrat A., Arenal R., Pellicer E., Cabo M., Lopez-Ortega A., Estrader M., Sort J., Dolors Baro M., Estrade S., Peiro F. EEL spectroscopic tomography: towards a new dimension in nanomaterials analysis. Ultramicroscopy 2012, 122:12-18.
12. Jin-Phillipp N.Y., Koch C.T., van Aken P.A. Towards quantitative core-loss EFTEM tomography. Ultramicroscopy 2011, 111:1255-1261.
13. Genc A., Cheng H., Winterstein J., Pullan L., Freitag B. 3D chemical mapping using tomography with an enhanced XEDS system. Microscopy and Analysis 2012, 116:23-25.
14. Huber D., Fraser H.L., Klenov D.O., von Harrach H.S., Zaluzec N.J. Relative sensitivity of XEDS vs EELS in the AEM. Late Breaking Poster Microscopy and Microanalysis 2010, Suppl. 2:16.
15. Kelly T.F., Larson D.J. Atom probe tomography 2012. Annual Review Materials Research 2012, 42:1-31.
16. Miller M.K., Russell K.F. Atom probe specimen preparation with a dual beam SEM/FIB miller. Ultramicroscopy 2007, 107:761-766.
17. Miller M.K., Russell K.F., Thompson G.B. Strategies for fabricating atom probe specimens with a dual beam FIB. Ultramicroscopy 2005, 102:287-298.
18. Gu M., Belharouak I., Genc A., Wang Z., Wang D., Amine K., Gao F., Zhou G., Thevuthasan S., Baer D.R., Zhang J.G., Browning N.D., Liu J., Wang C. Conflicting roles of nickel in controlling cathode performance in lithium ion batteries. Nano Letters 2012, 12:5186-5191.
19. Gu M., Belharouak I., Zheng J., Wu H., Xiao J., Genc A, Amine K., Thevuthasan S., Baer D.R., Zhang J.G., Browning N.D., Liu J., Wang C. Formation of the spinel phase in the layered composite cathode used in Li-ion batteries. Nano 2012, 10.1021/nn305065u.
20. Schlossmacher P., Klenov D.O., Freitag B., von Harrach H.S. Enhanced detection sensitivity with a new windowless XEDS system for AEM based on silicon drift detector technology. Microscopy Today 2010, 18:14-20.
21. Schlossmacher P., Klenov D.O., Freitag B., von Harrach H.S., Steinbach A. Nanoscale chemical compositional analysis with an innovative S/TEM-EDX system. Microscopy and Analysis (Nanotechnology Suppl.) 2010, 24:S5-S8.
22. Allen L.J., D'Alfonso A.J., Freitag B., Klenov D.O. Chemical mapping at atomic resolution using energy-dispersive x-ray spectroscopy. MRS Bulletin 2012, 37:47-52.
23. Hartel P., Rose H., Dinges C. Conditions and reasons for incoherent imaging in STEM. Ultramicroscopy 1996, 63:93-114.