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Volumn 122, Issue , 2012, Pages 12-18

EEL spectroscopic tomography: Towards a new dimension in nanomaterials analysis

Author keywords

Core loss; EELS; ICA; MVA; PCA; STEM; Tomography

Indexed keywords

3D STRUCTURE; ABERRATION-CORRECTED; ACQUISITION TIME; CHEMICAL DIMENSION; CHEMICAL INFORMATION; CORE-LOSS; DATA TREATMENT; ELECTRON TOMOGRAPHY; ENERGY FILTERING; LOW VOLTAGES; MULTIVARIATE ANALYSIS; MVA; NEW DIMENSIONS; PCA; SPECTROSCOPIC METHOD; SPECTROSCOPIC SIGNALS; SPECTRUM IMAGES; STEM; THREE DIMENSIONAL (3D) SHAPES; TOMOGRAPHIC RECONSTRUCTION; TRANSMISSION ELECTRON MICROSCOPE;

EID: 84865964620     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.07.020     Document Type: Article
Times cited : (40)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.