Toward quantitative core-loss EFTEM tomography

Ultramicroscopy

Volumn 111, Issue 8, 2011, Pages 1255-1261

  Jin Phillipp, N Y ^a   Koch, C T ^a   van Aken, P A ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

3D elemental mapping; EFTEM; Multiple scattering correction; Nanomaterials; Tomography

Indexed keywords

CARBON LAYERS; CHEMICAL INFORMATION; CORRECTION METHOD; DIFFRACTION CONTRAST; EFTEM; ELEMENTAL DISTRIBUTION; ELEMENTAL MAPPING; EXPERIMENTAL PARAMETERS; FE CATALYST; MULTIPLE-SCATTERING CORRECTION;

MONOLAYERS; SCATTERING; TOMOGRAPHY;

THREE DIMENSIONAL;

COPPER; DOUBLE WALLED NANOTUBE; IRON; NANOMATERIAL;

ACCURACY; ANALYTIC METHOD; ARTICLE; CONTROLLED STUDY; ELECTRON TOMOGRAPHY; ENERGY FILTERED TRANSMISSION ELECTRON MICROSCOPY; EXPERIMENTAL TEST; IMAGE QUALITY; IMAGE RECONSTRUCTION; MULTIPLE SCATTERING CORRECTION METHOD; OPTICAL RESOLUTION; QUANTITATIVE ANALYSIS; THREE DIMENSIONAL ELEMENTAL MAPPING; THREE DIMENSIONAL IMAGING;

EID: 80051827435     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.02.006     Document Type: Article

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